Ring Oscillator Aging Characterization in Conventional CMOS Technologies

التفاصيل البيبلوغرافية
العنوان: Ring Oscillator Aging Characterization in Conventional CMOS Technologies
المؤلفون: Kerber, Andreas, Kliza, Phil, Beckmeier, Daniel, Ravindranath, Abhimanyu, Yuan, Luo, Liu, Yun, Jungroth, Owen W.
المصدر: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2023 37th Symposium on. :1-5 Aug, 2023
Relation: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350319453
تدمد:28324218
DOI:10.1109/SBMicro60499.2023.10302522