التفاصيل البيبلوغرافية
العنوان: |
Ring Oscillator Aging Characterization in Conventional CMOS Technologies |
المؤلفون: |
Kerber, Andreas, Kliza, Phil, Beckmeier, Daniel, Ravindranath, Abhimanyu, Yuan, Luo, Liu, Yun, Jungroth, Owen W. |
المصدر: |
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2023 37th Symposium on. :1-5 Aug, 2023 |
Relation: |
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) |
قاعدة البيانات: |
IEEE Xplore Digital Library |