مؤتمر
Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip
| العنوان: | Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip |
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| المؤلفون: | Hamalainen, Roni, Lunnikivi, Henri, Hamalainen, Timo |
| المصدر: | 2023 IEEE Nordic Circuits and Systems Conference (NorCAS) Nordic Circuits and Systems Conference (NorCAS), 2023 IEEE. :1-7 Oct, 2023 |
| Relation: | 2023 IEEE Nordic Circuits and Systems Conference (NorCAS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350337570 |
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| DOI: | 10.1109/NorCAS58970.2023.10305453 |