PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks

التفاصيل البيبلوغرافية
العنوان: PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks
المؤلفون: Lamichhane, Subed, Jin, Wentian, Chen, Liang, Kavousi, Mohammadamir, Tan, Sheldon X.-D.
المصدر: 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD) Computer Aided Design (ICCAD), 2023 IEEE/ACM International Conference on. :1-9 Oct, 2023
Relation: 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350322255
تدمد:15582434
DOI:10.1109/ICCAD57390.2023.10323686