مؤتمر
Study on Failure Mechanisms of SiC Power Devices Induced by Heavy Ion Irradiation
| العنوان: | Study on Failure Mechanisms of SiC Power Devices Induced by Heavy Ion Irradiation |
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| المؤلفون: | Peng, Chao |
| المصدر: | 2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2023 5th International Conference on. :1-5 May, 2023 |
| Relation: | 2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350358872 |
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| DOI: | 10.1109/ICREED59404.2023.10390869 |