دورية أكاديمية
Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society
| العنوان: | Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society |
|---|---|
| المؤلفون: | Rupe, J., Laplante, P., Shieh, S.W. |
| المصدر: | IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 73(1):3-6 Mar, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189529 15581721 |
|---|---|
| DOI: | 10.1109/TR.2024.3366027 |