Lightweight Secured Split Test Technique with RMA Capability to Prevent IC Counterfeiting

التفاصيل البيبلوغرافية
العنوان:	Lightweight Secured Split Test Technique with RMA Capability to Prevent IC Counterfeiting
المؤلفون:	K, Sudeendra Kumar, Rekha, S. S., Koushik, Akshay, Swain, Ayas Kanta, Mahapatra, K. K.
المصدر:	2023 IEEE International Symposium on Smart Electronic Systems (iSES) ISES Smart Electronic Systems (iSES), 2023 IEEE International Symposium on. :191-196 Dec, 2023
Relation:	2023 IEEE International Symposium on Smart Electronic Systems (iSES)
قاعدة البيانات:	IEEE Xplore Digital Library