التفاصيل البيبلوغرافية
العنوان: |
A Quantifiable Detection of voids/Pores and Cracks in Scanning Electron Microscopic images using Machine Learning Techniques |
المؤلفون: |
M, Sornalakshmi, G, Elizabeth Rani, M, Sakthimohan, K, Karthiga Devi, M, Ponsuresh, M, Devadharshni. |
المصدر: |
2023 6th International Conference on Recent Trends in Advance Computing (ICRTAC) Recent Trends in Advance Computing (ICRTAC), 2023 6th International Conference on. :324-329 Dec, 2023 |
Relation: |
2023 6th International Conference on Recent Trends in Advance Computing (ICRTAC) |
قاعدة البيانات: |
IEEE Xplore Digital Library |