مؤتمر
A Quantifiable Detection of voids/Pores and Cracks in Scanning Electron Microscopic images using Machine Learning Techniques
| العنوان: | A Quantifiable Detection of voids/Pores and Cracks in Scanning Electron Microscopic images using Machine Learning Techniques |
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| المؤلفون: | M, Sornalakshmi, G, Elizabeth Rani, M, Sakthimohan, K, Karthiga Devi, M, Ponsuresh, M, Devadharshni. |
| المصدر: | 2023 6th International Conference on Recent Trends in Advance Computing (ICRTAC) Recent Trends in Advance Computing (ICRTAC), 2023 6th International Conference on. :324-329 Dec, 2023 |
| Relation: | 2023 6th International Conference on Recent Trends in Advance Computing (ICRTAC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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