دورية أكاديمية
Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application
| العنوان: | Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application |
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| المؤلفون: | Chen, X., Bai, Y., Cai, H., Zhu, C., Zhou, X., Zhang, Y., Liu, W. |
| المصدر: | IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 71(6):2632-2645 Jun, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15498328 15580806 |
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| DOI: | 10.1109/TCSI.2024.3382988 |