مؤتمر
Experimental Investigation of EM Side Channel and FI Attacks on Commercial FRAM Chips
| العنوان: | Experimental Investigation of EM Side Channel and FI Attacks on Commercial FRAM Chips |
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| المؤلفون: | Goswami, Bhanprakash, Suri, Manan |
| المصدر: | 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024 |
| Relation: | 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350371529 |
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| DOI: | 10.1109/EDTM58488.2024.10511546 |