التفاصيل البيبلوغرافية
| العنوان: |
New paradigm of Yield analysis in Big Data and AI Era in Semiconductor Manufacturing |
| المؤلفون: |
David, Jeffrey, Gupta, Ashutosh, Bamb, Rishi, Akar, Said, Holt, Jonathan, Strojwas, Andrzej, Brozek, Tomasz |
| المصدر: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024 |
| Relation: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
