Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm

التفاصيل البيبلوغرافية
العنوان:	Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm
المؤلفون:	Zhang, Shida, Rahman, Nael Mizanur, Wang, Wei-Chun, Kidambi, Narasimha Vasishta, Tokunaga, Carlos, Mukhopadhyay, Saibal
المصدر:	2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024
Relation:	2024 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات:	IEEE Xplore Digital Library