مؤتمر
Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm
العنوان: | Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm |
---|---|
المؤلفون: | Zhang, Shida, Rahman, Nael Mizanur, Wang, Wei-Chun, Kidambi, Narasimha Vasishta, Tokunaga, Carlos, Mukhopadhyay, Saibal |
المصدر: | 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024 |
Relation: | 2024 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!