مؤتمر
Prediction of High-Speed Oscillator Frequency Drift Under Package Level Reliability Tests
العنوان: | Prediction of High-Speed Oscillator Frequency Drift Under Package Level Reliability Tests |
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المؤلفون: | Wang, Ming-Han, Xiao, Christine, Liu, Chien, Hashemi, Hassan |
المصدر: | 2024 International Conference on Electronics Packaging (ICEP) Electronics Packaging (ICEP), 2024 International Conference on. :163-164 Apr, 2024 |
Relation: | 2024 International Conference on Electronics Packaging (ICEP) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9784991191176 |
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DOI: | 10.23919/ICEP61562.2024.10535661 |