Prediction of High-Speed Oscillator Frequency Drift Under Package Level Reliability Tests

التفاصيل البيبلوغرافية
العنوان: Prediction of High-Speed Oscillator Frequency Drift Under Package Level Reliability Tests
المؤلفون: Wang, Ming-Han, Xiao, Christine, Liu, Chien, Hashemi, Hassan
المصدر: 2024 International Conference on Electronics Packaging (ICEP) Electronics Packaging (ICEP), 2024 International Conference on. :163-164 Apr, 2024
Relation: 2024 International Conference on Electronics Packaging (ICEP)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9784991191176
DOI:10.23919/ICEP61562.2024.10535661