Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model

التفاصيل البيبلوغرافية
العنوان:	Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model
المؤلفون:	Lee, Seunggyu, Hyun, Daijoon, Jung, Younggwang, Cho, Gangmin, Shin, Youngsoo
المصدر:	2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024
Relation:	2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
قاعدة البيانات:	IEEE Xplore Digital Library