دورية أكاديمية
A Framework for the Generation of Monitor and Plant Model From Event Logs Using Process Mining for Formal Verification of Event-Driven Systems
العنوان: | A Framework for the Generation of Monitor and Plant Model From Event Logs Using Process Mining for Formal Verification of Event-Driven Systems |
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المؤلفون: | Xavier, M., Dubinin, V., Patil, S., Vyatkin, V. |
المصدر: | IEEE Open Journal of the Industrial Electronics Society IEEE Open J. Ind. Electron. Soc. Industrial Electronics Society, IEEE Open Journal of the. 5:517-534 2024 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 26441284 |
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DOI: | 10.1109/OJIES.2024.3406059 |