مؤتمر
An Examination of Machine Learning Techniques for Automating and Optimizing VLSI Design
| العنوان: | An Examination of Machine Learning Techniques for Automating and Optimizing VLSI Design |
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| المؤلفون: | Jeyarohini, R., Sathya, R, Sellapaandi, S. P., Kavitha, P, Ramesh, D. Raja, Mukherjee, Aparajita |
| المصدر: | 2024 International Conference on Science Technology Engineering and Management (ICSTEM) Science Technology Engineering and Management (ICSTEM), 2024 International Conference on. :1-6 Apr, 2024 |
| Relation: | 2024 International Conference on Science Technology Engineering and Management (ICSTEM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350376913 9798350376890 |
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| DOI: | 10.1109/ICSTEM61137.2024.10561035 |