Electrical-Performance Characteristics Prediction of Gate All Around Tunnel FET Using Machine Learning

التفاصيل البيبلوغرافية
العنوان: Electrical-Performance Characteristics Prediction of Gate All Around Tunnel FET Using Machine Learning
المؤلفون: Chand, Sourav, Tripathy, Manas Ranjan, Rana, Jogendra Singh, Jit, Satyabrata
المصدر: 2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S) Integrated Circuits, Communication, and Computing Systems (ICIC3S), 2024 International Conference on. 1:1-4 Jun, 2024
Relation: 2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350364088
DOI:10.1109/ICIC3S61846.2024.10603029