التفاصيل البيبلوغرافية
العنوان: |
Electrical-Performance Characteristics Prediction of Gate All Around Tunnel FET Using Machine Learning |
المؤلفون: |
Chand, Sourav, Tripathy, Manas Ranjan, Rana, Jogendra Singh, Jit, Satyabrata |
المصدر: |
2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S) Integrated Circuits, Communication, and Computing Systems (ICIC3S), 2024 International Conference on. 1:1-4 Jun, 2024 |
Relation: |
2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S) |
قاعدة البيانات: |
IEEE Xplore Digital Library |