التفاصيل البيبلوغرافية
العنوان: |
Development of Optoelectronic Control Measurement System Based on Attenuated Total Reflectance Effect |
المؤلفون: |
Rakhimov, Bakhtiyorjon N., Kengesbayev, Salauat K., Berdiyev, Alisher A. |
المصدر: |
2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2024 IEEE 25th International Conference of. :2640-2643 Jun, 2024 |
Relation: |
2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM) |
قاعدة البيانات: |
IEEE Xplore Digital Library |