Development of Optoelectronic Control Measurement System Based on Attenuated Total Reflectance Effect

التفاصيل البيبلوغرافية
العنوان: Development of Optoelectronic Control Measurement System Based on Attenuated Total Reflectance Effect
المؤلفون: Rakhimov, Bakhtiyorjon N., Kengesbayev, Salauat K., Berdiyev, Alisher A.
المصدر: 2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2024 IEEE 25th International Conference of. :2640-2643 Jun, 2024
Relation: 2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350389234
تدمد:2325419X
DOI:10.1109/EDM61683.2024.10614974