S-Boxes with Optimal Strict Avalanche Criterion using Chaotic Map

التفاصيل البيبلوغرافية
العنوان: S-Boxes with Optimal Strict Avalanche Criterion using Chaotic Map
المؤلفون: Duong, Phuc-Phan, Nguyen, Hieu Minh, Dao, Ba-Anh, Tran, Thai-Ha, Kieu-Do-Nguyen, Binh, Pham, Cong-Kha, Hoang, Trong-Thuc
المصدر: 2024 9th International Conference on Integrated Circuits, Design, and Verification (ICDV) Integrated Circuits, Design, and Verification (ICDV), 2024 9th International Conference on. :85-90 Jun, 2024
Relation: 2024 9th International Conference on Integrated Circuits, Design, and Verification (ICDV)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350371864
DOI:10.1109/ICDV61346.2024.10616714