مؤتمر
Introducing SW-based fault handling mechanisms to cope with EMI in embedded electronics: are they a good remedy?
العنوان: | Introducing SW-based fault handling mechanisms to cope with EMI in embedded electronics: are they a good remedy? |
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المؤلفون: | Vargas, F., Brum, D., Prestes, D., Bolzani, L., Rhod, E., Reorda, M. |
المصدر: | 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. On-line testing On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE. :163 2003 |
Relation: | 9th International IEEE On-Line Testing Symposium |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0769519687 9780769519685 |
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DOI: | 10.1109/OLT.2003.1214389 |