Physical compact model for threshold voltage in short-channel double-gate devices

التفاصيل البيبلوغرافية
العنوان: Physical compact model for threshold voltage in short-channel double-gate devices
المؤلفون: Keunwoo Kim, Fossum, J.G., Ching-Te Chuang
المصدر: International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. International Conference on. :223-226 2003
Relation: IEEE International Conference on Simulation of Semiconductor Processes and Devices
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780378261
9780780378261
DOI:10.1109/SISPAD.2003.1233677