مؤتمر
Emission from defects in thin gan epilayers grown on vicinal 4H-SiC substrates
العنوان: | Emission from defects in thin gan epilayers grown on vicinal 4H-SiC substrates |
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المؤلفون: | Xu, S.J., Wang, H.J., Cheung, S.H., Li, Q., Dai, X.Q., Xie, M.H., Tong, S.Y. |
المصدر: | 2002 Conference on Optoelectronic and Microelectronic Materials and Devices. COMMAD 2002. Proceedings (Cat. No.02EX601) Optoelectronic and microelectronic materials and device Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on. :95-98 2002 |
Relation: | 2002 Conference on Optoelectronic and Microelectron Materials and Devices |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780375718 9780780375710 |
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تدمد: | 10972137 |
DOI: | 10.1109/COMMAD.2002.1237201 |