دورية أكاديمية
Positive oxide charge-enhanced read disturb in a localized trapping storage flash memory cell
| العنوان: | Positive oxide charge-enhanced read disturb in a localized trapping storage flash memory cell |
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| المؤلفون: | Wen-Jer Tsai, Chih-Chieh Yeh, Nian-Kai Zous, Chen-Chin Liu, Shih-Keng Cho, Tahui Wang, Pan, S.C., Chih-Yuan Lu |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(3):434-439 Mar, 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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