مؤتمر
Mechanical failure strength characterization of silicon dice
| العنوان: | Mechanical failure strength characterization of silicon dice |
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| المؤلفون: | Chong, D.Y.R., Lee, W.E., Pang, J.H.L., Low, T.H., Lim, B.K. |
| المصدر: | Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003) Electronics packaging technology Electronics Packaging Technology, 2003 5th Conference (EPTC 2003). :600-605 2003 |
| Relation: | Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780382056 9780780382053 |
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| DOI: | 10.1109/EPTC.2003.1271591 |