دورية أكاديمية
Single electron effects and structural effects in ultrascaled silicon nanocrystal floating-gate memories
| العنوان: | Single electron effects and structural effects in ultrascaled silicon nanocrystal floating-gate memories |
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| المؤلفون: | Molas, G., De Salvo, B., Ghibaudo, G., Mariolle, D., Toffoli, A., Buffet, N., Puglisi, R., Lombardo, S., Deleonibus, S. |
| المصدر: | IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 3(1):42-48 Mar, 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 1536125X 19410085 |
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| DOI: | 10.1109/TNANO.2004.824016 |