مؤتمر
Plasma damage in HIMOS/spl trade/ non-volatile memories (NVM)
العنوان: | Plasma damage in HIMOS/spl trade/ non-volatile memories (NVM) |
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المؤلفون: | Ackaert, J., Lowe, A., De Backer, E., Boonen, S., Yao, T., Van Houdt, J., Haspeslagh, L. |
المصدر: | 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Integrated circuit design and technology Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on. :223-226 2004 |
Relation: | 2004 International Conference on Integrated Circuit Design and Technology |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780385284 9780780385283 |
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DOI: | 10.1109/ICICDT.2004.1309949 |