Plasma damage in HIMOS/spl trade/ non-volatile memories (NVM)

التفاصيل البيبلوغرافية
العنوان: Plasma damage in HIMOS/spl trade/ non-volatile memories (NVM)
المؤلفون: Ackaert, J., Lowe, A., De Backer, E., Boonen, S., Yao, T., Van Houdt, J., Haspeslagh, L.
المصدر: 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Integrated circuit design and technology Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on. :223-226 2004
Relation: 2004 International Conference on Integrated Circuit Design and Technology
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780385284
9780780385283
DOI:10.1109/ICICDT.2004.1309949