مؤتمر
A BIST algorithm for bit/group write enable faults in SRAMs
| العنوان: | A BIST algorithm for bit/group write enable faults in SRAMs |
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| المؤلفون: | Adham, S., Nadeau-Dostie, B. |
| المصدر: | Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. Memory technology, design and testing Memory Technology, Design and Testing, 2004. Records of the 2004 International Workshop on. :98-101 2004 |
| Relation: | Records of the 2004 International Workshop on Memory Technology, Design and Testing |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769521932 9780769521930 |
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| تدمد: | 10874852 |
| DOI: | 10.1109/MTDT.2004.1327991 |