مؤتمر
The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks
| العنوان: | The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks |
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| المؤلفون: | Hsin-Chia Lu, Tah-Hsiung Chu |
| المصدر: | 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) Microwave symposium digest Microwave Symposium Digest, 2004 IEEE MTT-S International. 3:1801-1804 Vol.3 2004 |
| Relation: | 2004 IEEE MTT-S International Microwave Symposium Digest |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780383311 9780780383319 |
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| تدمد: | 0149645X |
| DOI: | 10.1109/MWSYM.2004.1338952 |