مؤتمر
A review of laser induced techniques for microelectronic failure analysis
| العنوان: | A review of laser induced techniques for microelectronic failure analysis |
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| المؤلفون: | Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Gilfeather, G., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H. |
| المصدر: | Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :255-261 2004 |
| Relation: | Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780384547 9780780384545 |
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| DOI: | 10.1109/IPFA.2004.1345617 |