مؤتمر
Efficient template generation for instruction-based self-test of processor cores
العنوان: | Efficient template generation for instruction-based self-test of processor cores |
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المؤلفون: | Kambe, K., Inoue, M., Fujiwara, H. |
المصدر: | 13th Asian Test Symposium Asian test symposium Test Symposium, 2004. 13th Asian. :152-157 2004 |
Relation: | Proceedings. 13th Asian Test Symposium |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0769522351 9780769522357 |
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تدمد: | 10817735 |
DOI: | 10.1109/ATS.2004.39 |