مؤتمر
Defect analysis of degraded InGaP/GaAs HBTs
| العنوان: | Defect analysis of degraded InGaP/GaAs HBTs |
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| المؤلفون: | Pazirandeh, R., Zeimer, U., Kirmse, H., Wurfl, J., Trankle, G., Osterle, W. |
| المصدر: | IEEE Compound Semiconductor Integrated Circuit Symposium, 2004. Compound semiconductor integrated circuit symposium Compound Semiconductor Integrated Circuit Symposium, 2004. IEEE. :71-74 2004 |
| Relation: | IEEE Compound Semiconductor Integrated Circuit Symposium. 2004 IEEE CISC Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780386167 9780780386167 |
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| تدمد: | 15508781 |
| DOI: | 10.1109/CSICS.2004.1392493 |