مؤتمر
How circuit analysis and yield optimization can be used to detect circuit limitations before silicon results
| العنوان: | How circuit analysis and yield optimization can be used to detect circuit limitations before silicon results |
|---|---|
| المؤلفون: | Roma, C., Daglio, P., De Sandre, G., Pasotti, M., Poles, M. |
| المصدر: | Sixth international symposium on quality electronic design (isqed'05) Quality Electronic Design Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on. :107-112 2005 |
| Relation: | Proceedings. 6th International Symposium on Quality Electronic Design |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder كن أول من يترك تعليقا!