A robust alternative for the DRAM capacitor of 50 nm generation

التفاصيل البيبلوغرافية
العنوان: A robust alternative for the DRAM capacitor of 50 nm generation
المؤلفون: Kwang Hee Lee, Suk-Jin Chung, Jin Yong Kim, Ki-Chul Kim, Jae-Soon Lim, Kyuho Cho, Jinil Lee, Jeong-Hee Chung, HanJin Lim, KyungIn Choi, Sungho Han, SooIk Jang, Byeong-Yun Nam, Cha-Young Yoo, Sung-Tae Kim, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :841-844 2004
Relation: 2004 International Electron Devices Meeting
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780386841
9780780386846
DOI:10.1109/IEDM.2004.1419308