مؤتمر
Two-layer competitive Hopfield neural network for wafer defect detection
| العنوان: | Two-layer competitive Hopfield neural network for wafer defect detection |
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| المؤلفون: | Chan-Yu Chang, Si-Yan Lin, Mu Der Jeng |
| المصدر: | Proceedings. 2005 IEEE Networking, Sensing and Control, 2005. Networking, Sensing and Control Networking, Sensing and Control, 2005. Proceedings. 2005 IEEE. :1058-1063 2005 |
| Relation: | 2005 IEEE International Conference on Networking, Sensing and Control |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780388127 9780780388123 |
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| DOI: | 10.1109/ICNSC.2005.1461344 |