مؤتمر
Optimization and reliability characteristics of TiO/sub 2//HfO/sub 2/ multi-metal dielectric MOSFETs
| العنوان: | Optimization and reliability characteristics of TiO/sub 2//HfO/sub 2/ multi-metal dielectric MOSFETs |
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| المؤلفون: | Se Jong Rhee, Hyoung-Sub Kim, Chang Yong Kang, Chang Hwan Choi, Manhong Zhang, Feng Zhu, Tackhwi Lee, Injo Ok, Akbar, M.S., Krishnan, S.A., Lee, J.C. |
| المصدر: | Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. VLSI Technology VLSI Technology, 2005. Digest of Technical Papers. 2005 Symposium on. :168-169 2005 |
| Relation: | 2005 Symposium on VLSI Technology |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 4900784001 9784900784000 |
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| تدمد: | 07431562 21589682 |
| DOI: | 10.1109/.2005.1469254 |