Reliability of non-released microstructures: failure analysis and innovative solution process

التفاصيل البيبلوغرافية
العنوان: Reliability of non-released microstructures: failure analysis and innovative solution process
المؤلفون: Millet, O., Muller, P., Blanrue, O., Legrand, B., Collard, D., Buchaillot, L.
المصدر: The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. Solid-State Sensors, Actuators and Microsystems Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on. 1:840-842 Vol. 1 2005
Relation: TRANSDUCERS '05. The 13th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780389948
9780780389946
تدمد:2159547X
21641641
DOI:10.1109/SENSOR.2005.1496548