مؤتمر
Reliability of non-released microstructures: failure analysis and innovative solution process
العنوان: | Reliability of non-released microstructures: failure analysis and innovative solution process |
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المؤلفون: | Millet, O., Muller, P., Blanrue, O., Legrand, B., Collard, D., Buchaillot, L. |
المصدر: | The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. Solid-State Sensors, Actuators and Microsystems Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on. 1:840-842 Vol. 1 2005 |
Relation: | TRANSDUCERS '05. The 13th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780389948 9780780389946 |
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تدمد: | 2159547X 21641641 |
DOI: | 10.1109/SENSOR.2005.1496548 |