مؤتمر
Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs
| العنوان: | Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs |
|---|---|
| المؤلفون: | Anghel, C., Hefyene, N., Ionescu, A., Frere, S., Gillon, R., Rhayem, J. |
| المصدر: | 32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :247-250 2002 |
| Relation: | 32nd European Solid-State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 8890084782 9788890084782 |
|---|---|
| DOI: | 10.1109/ESSDERC.2002.194916 |