دورية أكاديمية
Interferometric detection in picosecond ultrasonics for nondestructive testing of submicrometric opaque multilayered samples: TiN/AlCu/TiN/Ti/Si
العنوان: | Interferometric detection in picosecond ultrasonics for nondestructive testing of submicrometric opaque multilayered samples: TiN/AlCu/TiN/Ti/Si |
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المؤلفون: | Rossignol, C., Perrin, B. |
المصدر: | IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on. 52(8):1354-1359 Aug, 2005 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 08853010 15258955 |
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DOI: | 10.1109/TUFFC.2005.1509794 |