Interferometric detection in picosecond ultrasonics for nondestructive testing of submicrometric opaque multilayered samples: TiN/AlCu/TiN/Ti/Si

التفاصيل البيبلوغرافية
العنوان:	Interferometric detection in picosecond ultrasonics for nondestructive testing of submicrometric opaque multilayered samples: TiN/AlCu/TiN/Ti/Si
المؤلفون:	Rossignol, C., Perrin, B.
المصدر:	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on. 52(8):1354-1359 Aug, 2005
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
تدمد:	08853010 15258955
DOI:	10.1109/TUFFC.2005.1509794