مؤتمر
Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage
| العنوان: | Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage |
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| المؤلفون: | Keshavarzi, A., Schrom, G., Tang, S., Ma, S., Bowman, K., Tyagi, S., Zhang, K., Linton, T., Hakim, N., Duvall, S., Brews, J., De, V. |
| المصدر: | ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005. Low power electronics and design Low Power Electronics and Design, 2005. ISLPED '05. Proceedings of the 2005 International Symposium on. :26-29 2005 |
| Relation: | ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 1595931376 9781595931375 |
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| DOI: | 10.1145/1077603.1077611 |