Improvement of the fault coverage of the pseudo-random phase in column-matching BIST

التفاصيل البيبلوغرافية
العنوان: Improvement of the fault coverage of the pseudo-random phase in column-matching BIST
المؤلفون: Fiser, P., Kubatova , H.
المصدر: 8th Euromicro Conference on Digital System Design (DSD'05) Digital System Design Digital System Design, 2005. Proceedings. 8th Euromicro Conference on. :56-63 2005
Relation: Proceedings. 8th Euromicro Conference on Digital System Design
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0769524338
9780769524337
DOI:10.1109/DSD.2005.51