مؤتمر
A Scan Matrix Design for Low Power Scan-Based Test
العنوان: | A Scan Matrix Design for Low Power Scan-Based Test |
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المؤلفون: | Shih Ping Lin, Chung Len Lee, Chen, J.E. |
المصدر: | 14th Asian Test Symposium (ATS'05) Test Symposium, 2005. Proceedings. 14th Asian. :224-229 2005 |
Relation: | 2005 14th Asian Test Symposium |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0769524818 9780769524818 |
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تدمد: | 10817735 23775386 |
DOI: | 10.1109/ATS.2005.14 |