A Scan Matrix Design for Low Power Scan-Based Test

التفاصيل البيبلوغرافية
العنوان: A Scan Matrix Design for Low Power Scan-Based Test
المؤلفون: Shih Ping Lin, Chung Len Lee, Chen, J.E.
المصدر: 14th Asian Test Symposium (ATS'05) Test Symposium, 2005. Proceedings. 14th Asian. :224-229 2005
Relation: 2005 14th Asian Test Symposium
قاعدة البيانات: IEEE Xplore Digital Library