مؤتمر
Impact of high DC bias on RF LDMOS reliability for radar application
| العنوان: | Impact of high DC bias on RF LDMOS reliability for radar application |
|---|---|
| المؤلفون: | Gares, M., Maanane, H., Masmoudi, M., Bertram, P., Marcon, J., Mourgues, K., Eudeline, Ph. |
| المصدر: | 2005 International Conference on Microelectronics Microelectronics Microelectronics, 2005. ICM 2005. The 17th International Conference on. :46-49 2005 |
| Relation: | Proceedings. The 17th ICM 2005. 2005 International Conference on Microelectronics |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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