مؤتمر
Thermal resistance measurement of LEDswith multi-chip packages
| العنوان: | Thermal resistance measurement of LEDswith multi-chip packages |
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| المؤلفون: | Lan Kim, Moo Whan Shin |
| المصدر: | Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Semiconductor Thermal Measurement and Management Symposium, 2006 IEEE Twenty-Second Annual IEEE. :186-190 2006 |
| Relation: | Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 1424401534 9781424401536 |
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| تدمد: | 10652221 |
| DOI: | 10.1109/STHERM.2006.1625226 |