دورية أكاديمية
Charge-based capacitance measurement for bias-dependent capacitance
| العنوان: | Charge-based capacitance measurement for bias-dependent capacitance |
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| المؤلفون: | Yao-Wen Chang, Hsing-Wen Chang, Tao-Cheng Lu, Ya-Chin King, Wenchi Ting, Yen-Hui Joseph Ku, Chih-Yuan Lu |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 27(5):390-392 May, 2006 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2006.873368 |