مؤتمر
Feature extraction and damage-precursors for prognostication of lead-free electronics
العنوان: | Feature extraction and damage-precursors for prognostication of lead-free electronics |
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المؤلفون: | Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Suhling, J., Lee, J. |
المصدر: | 56th Electronic Components and Technology Conference 2006 Electronic Components & Technology Electronic Components and Technology Conference, 2006. Proceedings. 56th. :10 pp. 2006 |
Relation: | 2006 Proceedings. 56th Electronic Components & Technology Conference |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 1424401526 9781424401529 |
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تدمد: | 05695503 23775726 |
DOI: | 10.1109/ECTC.2006.1645736 |