مؤتمر
Measurement and modeling of self-heating effects in SOI nMOSFETs
| العنوان: | Measurement and modeling of self-heating effects in SOI nMOSFETs |
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| المؤلفون: | Su, L.T., Goodson, K.E., Antoniadis, D.A., Flik, M.I., Chung, J.E. |
| المصدر: | 1992 International Technical Digest on Electron Devices Meeting Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International. :357-360 1992 |
| Relation: | Proceedings of IEEE International Electron Devices Meeting |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780308174 9780780308176 |
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| تدمد: | 01631918 |
| DOI: | 10.1109/IEDM.1992.307377 |