مؤتمر
High resolution X-ray diffraction and transmission electron microscopy investigation on As and P incorporation in MOCVD and CBE grown In(GaAs)P/InP 'false' multi quantum wells
| العنوان: | High resolution X-ray diffraction and transmission electron microscopy investigation on As and P incorporation in MOCVD and CBE grown In(GaAs)P/InP 'false' multi quantum wells |
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| المؤلفون: | Ferrari, C., Lazzarini, L., Salviati, G., Gastaldi, L., Taiarol, F., Schiavini, G., Rigo, C. |
| المصدر: | 1993 (5th) International Conference on Indium Phosphide and Related Materials Indium phosphide and related materials Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on. :199-202 1993 |
| Relation: | 1993 (5th) International Conference on Indium Phosphide and Related Materials |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780309936 9780780309937 |
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| DOI: | 10.1109/ICIPRM.1993.380675 |